Simulation of ion-track ranges in uranium oxide

Abstract

Direct comparisons between statistically sound simulations of ion-tracks and published experimental measurements of range densities of iodine implants in uranium dioxide have been made with implant energies in the range of 100-800 keV. Our simulations are conducted with REED-MD (Rare Event Enhanced Domain-following Molecular Dynamics) in order to account for the materials structure in both single crystalline and polycrystalline samples. We find excellent agreement between REED-MD results and experiments for polycrystalline target materials. © 2010 Published by Elsevier B.V.