Skip to main content
Journal Article

Study of the thickness of liquid layers by moiré deflectometry

  • Yogev D
  • Kafri O
  • Efrima S
Optics Letters (1988) 13(10) 934
DOI: 10.1364/ol.13.000934
12Citations
Citations of this article
8Readers
Mendeley users who have this article in their library.
Get full text

Abstract

We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.

Cite

CITATION STYLE

APA

Yogev, D., Kafri, O., & Efrima, S. (1988). Study of the thickness of liquid layers by moiré deflectometry. Optics Letters, 13(10), 934. https://doi.org/10.1364/ol.13.000934

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free