High Resolution EBSD Strain measurement

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1. High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.

   T B Britton, a J Wilkinson in Ultramicroscopy (2012)

   In this paper we explore methods of measuring elastic strain variations in the presence of larger lattice rotations (up to ∼11°) using high resolution electron backscatter diffraction. We have examined the fundamental equations which relate pattern…

   Added 2012-03-01 13 readers
2. Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction

   Angus J. Wilkinson, David Randman in Philosophical Magazine (2010)

   Added 2011-11-23 10 readers
3. Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction

   Angus J Wilkinson in Journal of Physics: Conference Series (2011)

   Added 2011-11-23 2 readers
4. On solving the orientation gradient dependency of high angular resolution EBSD

   Claire Maurice, Julian H. Driver, Roland Fortunier in Ultramicroscopy (2011)

   Current high angular resolution electron backscatter diffraction (HR-EBSD) methods are successful at measuring pure elastic strains but have difficulties with plastically deformed metals containing orientation gradients. The strong influences of…

   Added 2011-11-11 1 reader
5. Analysis of local chemical and structural inhomogeneities in FeySe1−xTex single crystals

   S. C. Speller, T. B. Britton, G. Hughes, S. Lozano-Perez, a. T. Boothroyd, E. Pomjakushina, et al. in Applied Physics Letters (2011)

   Co-existence of superconductivity and magnetism has been reported in certain regions of the Fe(Se,Te) phase diagram. Here, we address the key question of whether these different properties occur simultaneously within a homogeneous crystal or whether…

   Added 2011-11-09 3 readers
6. Towards high accuracy calibration of electron backscatter diffraction systems

   Ken Mingard, Austin Day, Claire Maurice, Peter Quested in Ultramicroscopy (2011)

   Added 2011-09-09 5 readers
7. A review of strain analysis using electron backscatter diffraction.

   Stuart I Wright, Matthew M Nowell, David P Field in Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada (2011)

   Since the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique…

   Added 2011-09-09 9 readers
8. Geometrically necessary dislocation density distributions in Ti–6Al–4V deformed in tension

   P.D. Littlewood, T.B. Britton, a.J. Wilkinson in Acta Materialia (2011)

   Added 2011-08-20 5 readers
9. A method for accurate localisation of EBSD pattern centres.

   Claire Maurice, Krzysztof Dzieciol, Roland Fortunier in Ultramicroscopy (2011)

   The moving screen technique for pattern centre localisation is revisited. A cross-correlation based iterative procedure is developed to find both the zoom factor and the zoom centre (which is also the pattern centre) between two EBSD diffraction…

   Added 2011-03-10 6 readers
10. Accuracy assessment of elastic strain measurement by EBSD.

    S Villert, C Maurice, C Wyon, R Fortunier in Journal of microscopy (2009)

    A detailed accuracy analysis of electron backscatter diffraction (EBSD) elastic strain measurement has been carried out using both simulated and experimental patterns. Strains are determined by measuring shifts between two EBSD patterns (one being…

    Added 2011-03-10 10 readers
11. Strain Determination Using Electron Backscatter Diffraction

    M. Krause, A. Graff, F. Altmann in AIP Conference Proceedings (2010)

    Inthe present paper we demonstrate the use of electron backscatterdiffraction (EBSD) for high resolution elastic strain determination. Here, wefocus on analysis methods based on determination of small shiftsin EBSD pattern with respect to a…

    Added 2011-03-10 5 readers
12. High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM.

    M D Vaudin, G. Stan, Y B Gerbig, R F Cook in Ultramicroscopy (2011)

    The surface morphology surrounding wedge indentations in (001) Si has been measured using electron backscattered diffraction (EBSD) and atomic force microscopy (AFM). EBSD measurement of the lattice displacement field relative to a strain-free…

    Added 2011-02-11 7 readers
13. Mapping of parent austenite orientation reconstructed from orientation of martensite by EBSD and application to ausformed martensite

    Naomichi Iwata, Naoki Takayama, Tadashi Furuhara Goro Miyamoto in Acta Materialia (2010)

    Added 2011-01-16 10 readers
14. Precise measurement of strain accommodation in austenite matrix surrounding martensite in ferrous alloys by electron backscatter diffraction analysis

    A. Shibata, T. Maki, T. Furuhara, G. Miyamoto in Acta Materialia (2009)

    Added 2011-01-16 14 readers
15. Accurate measurement of orientation relationship of lath martensite and bainite by electron backscatter diffraction analysis

    N. Takayama, T. Furuhara G. Miyamoto in Scripta Materialia (2009)

    Added 2011-01-16 15 readers
16. Characterisation of plastic zones around crack-tips in pure single-crystal tungsten using electron backscatter diffraction

    J D Murphy, a J Wilkinson, S G Roberts in IOP Conference Series: Materials Science and Engineering (2009)

    Added 2011-01-12 4 readers
17. Challenges in microstructural metrology for advanced engineered materials

    K P Mingard, B Roebuck, P Quested, E G Bennett in Metrologia (2010)

    Added 2011-01-12 2 readers
18. Measurement and Mapping of Small Changes of Crystal Orientation by Electron Backscattering Diffraction Measurement and Mapping of Small Changes of Crystal Orientation by Electron Backscattering Diffraction

    Xiaodong Tao, Alwyn Eades in Materials Science

    Added 2011-01-12 6 readers
19. Ultramicroscopy Reply to comment by Maurice et al . in response to ‘‘ Bragg ’ s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis ’’

    Josh Kacher, Jay Basinger, Brent L Adams, David T Fullwood in Ultramicroscopy (2010)

    Added 2011-01-12 6 readers
20. Micron review.pdf

    Angus J Wilkinson, Peter B Hirsch in Micron (1997)

    Added 2011-01-12 2 readers

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