Material characterization by means of transmission electron microscopy is reviewed. A novel technique for specimen preparation, a focused ion beam technique, is described. Emphasis is placed on the significance of in-situ heating experiments. The formation of silicon carbide by reaction of solid silicon with graphite at temperatures above 1673 K is presented as an application.
CITATION STYLE
Smith, D. J. (2005). Chapter 14 - High Resolution Transmission Electron Microscopy. Handbook of Microscopy for Nanotechnology, 427–453.
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