We report a combined reflectance difference spectroscopy and scanning tunneling microscopy study of ultrathin α-sexithiophene (6T) films deposited on the Cu(110)-(2×1)O surface. The correlation between the layer resolved crystalline structure and the corresponding optical spectra data reveals a highly sensitive dependence of the excitonic optical properties on the layer thickness and crystalline structure of the 6T film. © 2012 the Owner Societies.
CITATION STYLE
Sun, L., Berkebile, S., Weidlinger, G., Denk, M., Denk, R., Hohage, M., … Zeppenfeld, P. (2012). Layer resolved evolution of the optical properties of α-sexithiophene thin films. Physical Chemistry Chemical Physics, 14(39), 13651–13655. https://doi.org/10.1039/c2cp42270k
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