Minimizing rf-induced excess micromotion of a trapped ion with the help of ultracold atoms

6Citations
Citations of this article
10Readers
Mendeley users who have this article in their library.
Get full text

Abstract

We report on the compensation of excess micromotion due to parasitic rf-electric fields in a Paul trap. The parasitic rf-electric fields stem from the Paul trap drive but cause excess micromotion, e.g., due to imperfections in the setup of the Paul trap. We compensate these fields by applying rf-voltages of the same frequency, but adequate phases and amplitudes to Paul trap electrodes. The magnitude of micromotion is probed by studying elastic collision rates of the trapped ion with a gas of ultracold neutral atoms. Furthermore, we demonstrate that also reactive collisions can be used to quantify micromotion. We achieve compensation efficiencies of about 1 Vm-1, which is comparable to other conventional methods.

Cite

CITATION STYLE

APA

Mohammadi, A., Wolf, J., Krükow, A., Deiß, M., & Hecker Denschlag, J. (2019). Minimizing rf-induced excess micromotion of a trapped ion with the help of ultracold atoms. Applied Physics B: Lasers and Optics, 125(7). https://doi.org/10.1007/s00340-019-7223-y

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free