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Journal Article

Noise in Integrated-Circuit Transistors

IEEE Journal of Solid-State Circuits (1970) 5(2) 63-66
DOI: 10.1109/JSSC.1970.1050072
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Abstract

Recent noise measurements from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed. Copyright © 1970 by The Institute of Electrical and Electronics Engineers, Inc.

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Jaeger, R. C., & Chenette, E. R. (1970). Noise in Integrated-Circuit Transistors. IEEE Journal of Solid-State Circuits, 5(2), 63–66. https://doi.org/10.1109/JSSC.1970.1050072

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