Noncontact Atomic Force Microscopy
- ISBN: 3540431179 (alk. paper)
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved\nremarkable progress. Based on nanomechanical methods, the NC-AFM\ndetects the weak attractive force between the tip of a cantilever\nand a sample surface. This method has the following characteristics:\nit has true atomic resolution; it can measure atomic force interactions,\ni.e. it can be used in so-called atomic force spectroscopy (AFS);\nit can also be used to study insulators; and it can measure mechanical\nresponses such as elastic deformation. This is the first book that\ndeals with all of the emerging NC-AFM issues.