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Predictive reliability and prognostics for electronic components: current capabilities and future challenges

by Christopher Bailey, Hua Lu, Stoyan Stoyanov, Chunyan Yin, Tim Tilford, Stephen Ridout
International Spring Seminar on Electronics Technology (2008)

Abstract

Future analysis tools that predict the behavior of electronic components, both during qualification testing and in-service lifetime assessment, will be very important in predicting product reliability and identifying when to undertake maintenance. This paper will discuss some of these techniques and illustrate these with examples. The paper will also discuss future challenges for these techniques.

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