Radon daughter plate-out onto Teflon

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Abstract

Radiopure materials for detector components in rare event searches may be contaminated after manufacturing with long-lived 210Pb produced by the decay of atmospheric radon. Charged radon daughters deposited on the surface or implanted in the bulk of detector materials have the potential to cause noticeable backgrounds within dark matter regions of interest. Understanding the mechanics governing these background signals is therefore a paramount concern in dark matter experiments in order to distinguish a real signal from internal detector backgrounds. Teflon (i.e. PTFE) is a specific material of interest because it makes up the walls of the inner detector of many liquid noble detectors such as the LUX-ZEPLIN experiment. The rate of radon daughter plate-out onto Teflon can be orders of magnitude larger than the plate-out rate onto other materials. Mitigation of plate-out onto Teflon and steel by proximity to other materials is demonstrated.

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Morrison, E. S., Frels, T., Miller, E. H., Schnee, R. W., & Street, J. (2018). Radon daughter plate-out onto Teflon. In AIP Conference Proceedings (Vol. 1921). American Institute of Physics Inc. https://doi.org/10.1063/1.5019012

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