Semiconductor testing in the 21st century

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Abstract

In the 21st century, with clock rates expected at GHz+, a new and innovative method of verification for silicon devices is anticipated to arise. It will eliminate the need for the massive numbers of blocked drivers and coax. It will lend versatility to parallel deviced test while reducing the overall cost and improving the throughput for a better bottom line. The new system will be up-gradable in speed and density very inexpensively. It will be much easier to install and give quicker time to market for new devices.

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APA

Vogley, B. (1995). Semiconductor testing in the 21st century. In Northcon - Conference Record (pp. 72–75). IEEE. https://doi.org/10.1109/northc.1995.484959

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