Elemental Cu nanocrystals were synthesized in thin film SiO2 by ion implantation and thermal annealing. The local atomic structure and nanocrystal size distribution were investigated by means of extended X-ray absorption fine structure (EXAFS) spectroscopy and small angle X-ray scattering (SAXS), respectively. We quantify the bondlength contraction and increased structural disorder in the nanocrystals as compared to a bulk Cu reference. Both are proportional to the inverse of the nanocrystal diameter, which in turn is proportional to the surface-area-to-volume ratio. In particular we show that a simple liquid-drop model can explain the bondlength contraction and estimate the surface tension of nanocrystalline Cu to be 3.8 ± 0.4 J/m2. © 2005 Elsevier B.V. All rights reserved.
CITATION STYLE
Johannessen, B., Kluth, P., Cookson, D. J., Foran, G. J., & Ridgway, M. C. (2006). Size-dependent structural disorder in nanocrystalline Cu probed by synchrotron-based X-ray techniques. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 246(1), 45–49. https://doi.org/10.1016/j.nimb.2005.12.015
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