Spatially Resolved Luminescence Spectroscopy

Abstract

Spatially resolved luminescence spectroscopy is a useful tool for the study of semiconductors with inhomogeneities of their properties on submicrometer scale and semiconductor nanostructures. In this chapter, basic operation principles, instrumentation, and advantages and disadvantages of micro-photoluminescence (μ-PL), confocal microscopy, scanning near-field optical microscopy (SNOM), and cathodoluminescence (CL) are discussed.