Structure of pentacene thin films
Grazing incidence x-ray diffraction, x-ray reflectivity and atomic\nforce microscopy have been performed to study the structure of pentacene\nthin films on oxidized Si substrates from submonolayer to multilayer\ncoverages. The volume of the unit cell in the thin film phase is\nalmost identical to that of the bulk phase, thus the molecular packing\nefficiency is effectively the same in both phases. The structure\nforming from the first monolayer remains the same for films at least\n190 Ã thick. The in-plane structure of the submonolayer islands\nalso remains unchanged within a substrate temperature range of 0<Tsub<45\nÂ°C while the island size changes by more than a factor of 4.