Structure of pentacene thin films

Abstract

Grazing incidence x-ray diffraction, x-ray reflectivity and atomic force microscopy have been performed to study the structure of pentacene thin films on oxidized Si substrates from submonolayer to multilayer coverages. The volume of the unit cell in the thin film phase is almost identical to that of the bulk phase, thus the molecular packing efficiency is effectively the same in both phases. The structure forming from the first monolayer remains the same for films at least 190 Angstrom thick. The in-plane structure of the submonolayer islands also remains unchanged within a substrate temperature range of 0<T-sub<45 degreesC while the island size changes by more than a factor of 4. (C) 2004 American Institute of Physics.

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