Supplementary Information

  • Shi G
  • Shen J
N/ACitations
Citations of this article
4Readers
Mendeley users who have this article in their library.

Abstract

Characterization: X-ray diffraction (XRD) patterns were collected in ambient atmosphere by a Philips X'Pert powder diffractometer with Cu Kα radiation (λ=1.5418 Å). The 2θ scans covered the range of 10° to 80° with a step of 0.02°. The applied voltage and current were 40 kV and 40 mA, respectively. The scanning electron microscopy (SEM) measurements were carried out using the Leo 1530 Gemini microscope operated at 20 kV. The BET surface areas were measured on the ASAP 2020 instrument at 77.3 K using N 2 as the adsorbate. Thermogravimetric analysis/mass spectroscopy (TG-MS) measurements were carried out on a STA 449C TG/DTA instrument equipped with a mass spectrometer (ThermoStar TM) under N 2 atmosphere. The temperature-programmed rate was 10 K/min up to 773 K. Elemental analysis was performed by inductively coupled plasma/optical emission spectrometry (ICP-OES, Optima 5300, Perkin Elmer) using solutions prepared by dissolving samples in aqua regia. Catalytic test: The catalysts were tested in a three-phase trickle-bed reactor for the

Cite

CITATION STYLE

APA

Shi, G., & Shen, J. (2009). Supplementary Information, (c), 1–3.

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free