The role of transmission electron microscopy (TEM) in characterisation of silica-based mesoporous molecular sieves is discussed. It is demonstrated that TEM can not only serve as a supporting technique as presented in many relevant reports, but also give us a lot of valuable structural information which could not be gained from other experiments. © 2000 Elsevier Science B.V. All rights reserved.
CITATION STYLE
Zhou, W. (2000). What does TEM tell us about mesoporous silicas. Studies in Surface Science and Catalysis, 129, 525–534. https://doi.org/10.1016/s0167-2991(00)80254-2
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