The effective complex conductivity tensor of a highly anisotropic, vertically aligned silicon nanowire film was measured by terahertz time-domain spectroscopy. The silicon nanowires were fabricated on a p-type silicon substrate by metal-assisted chemical etching, which resulted in a film with uniaxially anisotropic optical properties. The measured terahertz transverse and longitudinal conductivity values were in excellent agreement with the results of calculations based on the Drude-Smith and Lorentz models, respectively. © 2012 American Institute of Physics.
CITATION STYLE
Lim, M., Choi, S. J., Lee, G. S., Seol, M. L., Do, Y., Choi, Y. K., & Han, H. (2012). Terahertz time-domain spectroscopy of anisotropic complex conductivity tensors in silicon nanowire films. Applied Physics Letters, 100(21). https://doi.org/10.1063/1.4721490
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