TRENDS IN DESIGN FOR TESTABILITY.

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Abstract

This paper will present the currently used techniques in the area of Design for Testability. It will begin with the Ad Hoc approaches of In-Circuit techniques, Functional Testing and Signature Analysis. Then the Structured Approaches of Scan Design will be discussed. Finally the techniques of Self-Testing will be discussed such as BILBO, and Exhaustive Testing. With each of these areas, the trends in usage will be indicated.

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Williams, T. W. (1986). TRENDS IN DESIGN FOR TESTABILITY. (pp. 146–148). Delft Univ of Technology. https://doi.org/10.1109/esscirc.1986.5468360

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