This paper will present the currently used techniques in the area of Design for Testability. It will begin with the Ad Hoc approaches of In-Circuit techniques, Functional Testing and Signature Analysis. Then the Structured Approaches of Scan Design will be discussed. Finally the techniques of Self-Testing will be discussed such as BILBO, and Exhaustive Testing. With each of these areas, the trends in usage will be indicated.
CITATION STYLE
Williams, T. W. (1986). TRENDS IN DESIGN FOR TESTABILITY. (pp. 146–148). Delft Univ of Technology. https://doi.org/10.1109/esscirc.1986.5468360
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