Carrier conductance in 2D WSe2 films

Abstract

We have employed first-principles density functional calculations using Quantum ESPRESSO software to study the carrier conductance in few-layer thick 2D WSe2 semiconducting films. The results of this simulation are then compared to the experimental results where the films were grown via atomic layer deposition. The contact resistances were determined using the transfer line method. A comparison of experimental and simulated carrier conductance values shows a good agreement.