Abstract
This chapter shows how scanning tunneling microscopy and spectroscopy and atomic force microscopy can be used to measure the properties of individual nanocrystals, thereby circumventing the limitations of ensemble based measurements.
Cite
CITATION STYLE
APA
Liljeroth, P., Grandidier, B., Delerue, C., & Vanmaekelbergh, D. (2014). Scanning probe microscopy and spectroscopy. In Nanoparticles: Workhorses of Nanoscience (Vol. 9783662448236, pp. 223–255). Springer-Verlag Berlin Heidelberg. https://doi.org/10.1007/978-3-662-44823-6_8
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
Already have an account? Sign in
Sign up for free