Degradation of organic light emitting diodes with cleaned ITO and MoO 3 hole-injection layer

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Abstract

We study the effect of indium tin oxide (ITO) cleaning and hole-injection layer (HIL) insertion on performance of organic light emitting diodes (OLEDs) device, especially the degradation. We prepare higher- and lower-level cleaned ITOs and molybdenum oxide (MoO3) as HIL. OLED with higher-level cleaned ITO and without MoO3 gives the lower driving voltage, while a good stability in chromaticity and power efficiency is obtained from OLEDs with MoO3. The degradation of power efficiency is reduced in OLEDs with MoO3 and lower-level cleaned ITO. © 2010 Published by Elsevier B.V.

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Kishimoto, T., Wako, K., Matsuda, K., Iguchi, H., & Tsuboi, T. (2011). Degradation of organic light emitting diodes with cleaned ITO and MoO 3 hole-injection layer. In Physics Procedia (Vol. 14, pp. 235–238). Elsevier B.V. https://doi.org/10.1016/j.phpro.2011.05.048

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