Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
CITATION STYLE
Fritz, R., Beyer, A., Stolz, W., Müller, K., Schowalter, M., Rosenauer, A., … Volz, K. (2011). Quantitative Analysis of Chemical Composition Using HAADF-STEM in a JEOL 2200FS. Microscopy and Microanalysis, 17(S2), 1410–1411. https://doi.org/10.1017/s1431927611007926
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