Rice grain resistance to brown spot and yield are increased by silicon

Abstract

Brown spot, caused by Bipolaris oryzae, is one of the most important diseases of rice and can cause a reduction in yield and grain quality. The effect of silicon (Si) on the resistance of rice grains to brown spot was investigated. Plants from cv. Oochikara and its mutant, defective in the Lsi1 transporter (lsi1 mutant), were grown in hydroponic culture either with Si (+Si; 2 mM) or without Si (-Si). Panicle inoculation with B. oryzae was carried out at the beginning of the milk-grain stage. Panicles were harvested at physiological grain maturity. The supply of Si significantly increased Si concentration in husks compared to -Si plants. Si concentration in husks from cv. Oochikara was up to three times greater than the lsi1 mutant. In the presence of Si, brown spot severity was reduced by 88% in grains from cv. Oochikara and by 53% in grains from lsi1 mutant. Brown spot severity was 77% lower for grains of cv. Oochikara than for the lsi1 mutant, both plant types were grown in the presence of Si. Panicle inoculation reduced significantly the following yield components: number of grains per panicle, the weight of 1000 grains and the percentage of filled grains. Si significantly increased these yield components, especially for inoculated panicles. Considering kernel quality, the panicle inoculation with B. oryzae significantly reduced the yield of husked kernel, yield of whole kernel and kernel diameter, especially for grains from -Si plants. For panicles from +Si plants, the kernel quality was improved under inoculation, compared to -Si plants. Results from this study show that Si improved rice yield and kernel quality in panicles inoculated with B. oryzae. Furthermore the functional Lsi1 gene contributed significantly for increasing the yield of whole kernel and kernel diameter, possibly due to the increasing Si concentration in husks. © by the Brazilian Phytopathological Society.