Specific emitter identification against unreliable features interference based on time-series classification network structure

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Abstract

Specific emitter identification (SEI) aims to distinguish different emitter individuals based on the subtle differences in the signals. The technology can be widely applied to various wireless communication systems. Existing individual identification methods often ignore the radio frequency (RF) fingerprint information carried by the waveforms and thus can be interfered by unreliable RF features. To alleviate these issues, we devise the deep bidirectional long short-term memory (DBi-LSTM) and the one-dimensional residual convolution network with dilated convolution and squeeze-and-excitation block (Conv-OrdsNet). We exploit the combination of DBi-LSTM and Conv-OrdsNet (CoBONet) to extract temporal structure features directly from baseband in-phase and quadrature (I/Q) samples. The proposed network is able to capture the fine-grained details of signals and combine different information extracted by two networks. Moreover, we propose a data augmentation method to solve the interference of unreliable features by randomly changing the values of noise, power, frequency offset (FO), and phase offset (PO). It is worth noting that our method only needs a short slice of a steady-state signal without complex preprocessing, which reduces the cost of acquisition and calculation. Extensive experiments show that our method can effectively extract reliable RF fingerprinting features from I/Q samples and the classification results are better than most existing methods.

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Liu, Y., Xu, H., Qi, Z., & Shi, Y. (2020). Specific emitter identification against unreliable features interference based on time-series classification network structure. IEEE Access, 8, 200194–200208. https://doi.org/10.1109/ACCESS.2020.3035813

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