LabVIEW-based data acquisition system for Diode I-V Characterization

Abstract

This work describes computerized data acquisition system for current-voltage (I-V) characteristics of diodes. The proposed system consist of a personal computer pre-installed with LabVIEW, two units of power supply, an interface board, current and voltage sensors. Two devices under test (DUTs) are selected namely 1N4007 silicon and 1N34 germanium diodes. The current flow through the circuit and voltage across the diode is measured and I-V characteristic is successfully plotted. When data acquisition interrupted by the user, real time I-V curve with least-square fitting is plotted. The LabVIEW was employed primarily to display data from sensors and storing collected data for further post-measurement processing. Estimated forward voltage drop from plotted I-V curve was then compared with the published value from manufacturer's datasheet. Comparison revealed that developed system has been successfully characterized both DUTs base on the forward voltage drop obtained from the plotted I-V curve. Furthermore, proposed system architecture offers extra flexibility where stored data can be manipulated with minimum programming efforts. The application of the proposed system can also be extended for in-situ device characterization in various circuits.