Abstract
Unlike graphene, the existence of bandgaps (1-2 eV) in the layered semiconductor molybdenum disulphide, combined with mobility enhancement by dielectric engineering, offers an attractive possibility of using single-layer molybdenum disulphide field-effect transistors in low-power switching devices. However, the complicated process of fabricating single-layer molybdenum disulphide with an additional high-k dielectric layer may significantly limit its compatibility with commercial fabrication. Here we show the first comprehensive investigation of process-friendly multilayer molybdenum disulphide field-effect transistors to demonstrate a compelling case for their applications in thin-film transistors. Our multilayer molybdenum disulphide field-effect transistors exhibited high mobilities ( > 100 cm2 V ?1 s ?1), near-ideal subthreshold swings (∼70mV per decade) and robust current saturation over a large voltage window. With simulations based on Shockley's long-channel transistor model and calculations of scattering mechanisms, these results provide potentially important implications in the fabrication of high-resolution large-area displays and further scientific investigation of various physical properties expected in other layered semiconductors. © 2012 Macmillan Publishers Limited. All rights reserved.
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CITATION STYLE
Kim, S., Konar, A., Hwang, W. S., Lee, J. H., Lee, J., Yang, J., … Kim, K. (2012). High-mobility and low-power thin-film transistors based on multilayer MoS2 crystals. Nature Communications, 3. https://doi.org/10.1038/ncomms2018
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