Progress in deep-UV photoresists

21Citations
Citations of this article
20Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Higher resolution can be achieved in lithography by decreasing the wavelength of the exposure source. However, resist material and their processing are also important when we move to a shorter wavelength lithography technology. This paper reviews the recent development and challenges of deep-UV photoresists and their processing technology.

Cite

CITATION STYLE

APA

Sahoo, P. B., Vyas, R., Wadhwa, M., & Verma, S. (2002). Progress in deep-UV photoresists. Bulletin of Materials Science, 25(6), 553–556. https://doi.org/10.1007/BF02710549

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free