Higher resolution can be achieved in lithography by decreasing the wavelength of the exposure source. However, resist material and their processing are also important when we move to a shorter wavelength lithography technology. This paper reviews the recent development and challenges of deep-UV photoresists and their processing technology.
CITATION STYLE
Sahoo, P. B., Vyas, R., Wadhwa, M., & Verma, S. (2002). Progress in deep-UV photoresists. Bulletin of Materials Science, 25(6), 553–556. https://doi.org/10.1007/BF02710549
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