Abstract
Metalorganic chemical vapor deposition-grown In0.4Ga 0.6As0.995N0.005 quantum well (QW) lasers have been realized, at an emission wavelength of 1.295 μm, with threshold and transparency current densities as low as 211 A/cm2 (for L=2000 μm) and 75 A/cm2, respectively. The utilization of a tensile-strained GaAs0.67P0.33 buffer layer and GaAs0.85P 0.15 barrier layers allows a highly-compressively-strained In 0.4Ga0.6As0.995N0.005 QW to be grown on a high-Al-content lower cladding layer, resulting in devices with high current injection efficiency (ηinj∼97%). © 2002 American Institute of Physics.
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CITATION STYLE
Tansu, N., Kirsch, N. J., & Mawst, L. J. (2002). Low-threshold-current-density 1300-nm dilute-nitride quantum well lasers. Applied Physics Letters, 81(14), 2523–2525. https://doi.org/10.1063/1.1511290
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