Influence of Annealing Temperature on the Structure and Performance of YBCO Thin Film on MgO Substrate

Abstract

Annealing treatment is adopted for studying the changes of structure and low temperature superconducting performance of YBCO thin film on MgO Substrate. X-ray diffraction (XRD) analysis results show that c axis orientation of YBCO thin film is optimized with the rise of annealing temperature. It reaches the optimum value at 720 °C. The c axis orientation of YBCO thin film shows recession when the annealing temperature is higher than 720 °C. The change trend of increasing firstly and decreasing subsequently is also discovered with annealing temperature, the optimal critical current density value is obtained at about 730 °C. Research results show that the YBCO thin film structure and low temperature superconducting performance can be effectively improved through optimizing annealing temperature.