A universal machine-learning-based automated testing system for consumer electronic products

Abstract

Consumer electronic manufacturing (CEM) companies face a constant challenge to main-tain quality standards during frequent product launches. A manufacturing test verifies product functionality and identifies manufacturing defects. Failure to complete testing can even result in product recalls. In this research, a universal automated testing system has been proposed for CEM companies to streamline their test process in reduced test cost and time. A universal hardware interface is designed for connecting commercial off-the-shelf (COTS) test equipment and unit under test (UUT). A software application, based on machine learning, is developed in LabVIEW. The test site data for around 100 test sites have been collected. The application automatically selects COTS test equipment drivers and interfaces on UUT and test measurements for test sites through a universal hardware interface. Further, it collects real-time test measurement data, performs analysis, generates reports and key performance indicators (KPIs), and provides recommendations using machine learning. It also maintains a database for historical data to improve manufacturing processes. The proposed system can be deployed standalone as well as a replacement for the test department module of enterprise resource planning (ERP) systems providing direct access to test site hardware. Finally, the system is validated through an experimental setup in a CEM company.