Abstract
A new method is demonstrated for the quantification of Ti-O-Si and Ti-O-Ti bonds in Ti-Si binary oxides. It is based on the linear combination of two reference X-ray absorption near-edge structure (XANES) spectra at the Ti K edge. The proper selection of a Ti-O-Si reference material is most important for the successful application of this method. Three Ti-Si binary oxide systems have been analysed by the new method: Ti-Si mixed oxides, titania supported on silica and Ti-substituted MCM-41 (crystalline mesoporous molecular sieve material invented by Mobil) with various Ti contents.
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Lee, J. S., Kim, W. B., & Choi, S. H. (2001). Linear combination of XANES for quantitative analysis of Ti-Si binary oxides. Journal of Synchrotron Radiation, 8(2), 163–167. https://doi.org/10.1107/S0909049500020331
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