Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering

G Pavia; G Benner; H Niebel; E Rauch; M Véron

Journal ArticleOPEN ACCESS

Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering

Pavia G
Benner G
Niebel H
et al.

Microscopy and Microanalysis (2011) 17(S2) 1074-1075

DOI: 10.1017/s1431927611006246

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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APA

Pavia, G., Benner, G., Niebel, H., Rauch, E., & Véron, M. (2011). Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering. Microscopy and Microanalysis, 17(S2), 1074–1075. https://doi.org/10.1017/s1431927611006246

Crystal Orientation Mapping via STEM/NBD: Improved Quality with Precession Electron Diffraction and Energy Filtering

Abstract

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