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Analysis and Artifacts in EELS Spectrum Imaging

  • Mundy J
  • Fitting Kourkoutis L
  • Xin H
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 782-783
DOI: 10.1017/s1431927611004788
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Mundy, J., Fitting Kourkoutis, L., Xin, H., & Muller, D. (2011). Analysis and Artifacts in EELS Spectrum Imaging. Microscopy and Microanalysis, 17(S2), 782–783. https://doi.org/10.1017/s1431927611004788

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