Abstract
The secondary electron emission coefficient γ of different MgO single crystal has been measured by γ-focused ion beam system. It is found that the MgO single crystal with (111) orientation has the highest γ from 0.08 up to 0.21, while from 0.06 to 0.19 for (200) and from 0.05 to 0.15 for (220) orientation for operating Ne+ ions ranging from 50 to 300 eV throughout this experiment. It is also found that these observations can be explained by work functions, which are dependent on the crystal orientations of MgO. © 1999 American Institute of Physics.
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CITATION STYLE
Choi, E. H., Lim, J. Y., Kim, Y. G., Ko, J. J., Kim, D. I., Lee, C. W., & Cho, G. S. (1999). Secondary electron emission coefficient of a MgO single crystal. Journal of Applied Physics, 86(11), 6525–6527. https://doi.org/10.1063/1.371618
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