Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Cite
CITATION STYLE
APA
Longo, P., Twesten, R. D., & Kothleitner, G. (2013). Fast STEM EELS Spectrum Imaging analysis of Pd-Au based catalysts. Microscopy and Microanalysis, 19(S2), 1612–1613. https://doi.org/10.1017/s1431927613010052
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