A method for simulating risk profiles of wheat yield in data-sparse conditions

Abstract

Process-based crop models are a robust approach to assess climate impacts on crop productivity and long-term viability of cropping systems. However, these models require high-quality climate data that cannot always be met. To overcome this issue, the current research tested a simple method for scaling daily data and extrapolating long-term risk profiles of modelled crop yields. An extreme situation was tested, in which high-quality weather data was only available at one single location (reference site: Snowtown, South Australia, 33.78°S, 138.21°E), and limited weather data was available for 49 study sites within the Australian grain belt (spanning from 26.67 to 38.02°S of latitude, and 115.44 to 151.85°E of longitude). Daily weather data were perturbed with a delta factor calculated as the difference between averaged climate data from the reference site and the study sites. Risk profiles were built using a step-wise combination of adjustments from the most simple (adjusted series of precipitation only) to the most detailed (adjusted series of precipitation, temperatures and solar radiation), and a variable record length (from 10 to 100 years). The simplest adjustment and shortest record length produced bias of modelled yield grain risk profiles between -10 and 10% in 41% of the sites, which increased to 86% of the study sites with the most detailed adjustment and longest record (100 years). Results indicate that the quality of the extrapolation of risk profiles was more sensitive to the number of adjustments applied rather than the record length per se.