Abstract
A beamline for X-ray free electron laser (XFEL) has been developed at SACLA, SPring-8 Angstrom Compact free electron LAser. The beamline delivers and diagnoses an XFEL beam without degrading the beam quality. The transport optics are applicable in the range of 4-30 keV with a double-crystal monochromator or 4-15 keV with either of two double-mirror systems. A photon diagnostic system of the beamline monitors intensity, photon energy, center-of-mass position, and spatial profile in shot-by-shot and non-destructive manners. © 2013 IOP Publishing Ltd.
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CITATION STYLE
Tono, K., Inubushi, Y., Sato, T., Togashi, T., Ohashi, H., Kimura, H., … Yabashi, M. (2013). Beamline for X-ray free electron laser of SACLA. In Journal of Physics: Conference Series (Vol. 425). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/425/7/072006
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