Abstract
Bismuth telluride (Bi2Te3) was analyzed using x-ray photoelectron spectroscopy. A freshly exfoliated, oxygen-free flake was analyzed. Spectral regions for O 1s, Te 3d, C 1s, Bi 4f, Bi 5d, and Te 4d were acquired. Bulk quantitative analyses by x-ray fluorescence, inductively coupled plasma-mass spectrometry, and x-ray diffraction indicated that the material was stoichiometric, contained low concentrations of impurities, and was phase pure, respectively.
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CITATION STYLE
APA
Shallenberger, J. R., Smyth, C. M., Addou, R., & Wallace, R. M. (2019). 2D bismuth telluride analyzed by XPS. Surface Science Spectra, 26(2). https://doi.org/10.1116/1.5120015
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