LEEM and PEEM as Probing Tools to Address Questions in Catalysis

Abstract

Abstract: Catalysis is a hot topic in research with the focus on finding catalysts that show better activity or selectivity on processes on technological or industrial interest. The use of model systems of applicable materials has proven to be a successful approach in the last decades to obtain information on the fundamental properties of these materials, leading eventually to a better understanding how real catalysts work. This knowledge is extremely important in the sense that it allows an optimization of the catalyst composition, thus leading to a rational design of new materials. For these fundamental studies, a variety of probing techniques such as X-ray photo-electron spectroscopy, scanning tunnel microscopy, and temperature programmed desorption have been applied. In this article, we discuss how low energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) can contribute to the fundamental understanding of relevant surface processes taking place on model catalysts. Also, the capability of these techniques on addressing open questions in catalysis is discussed. [Figure not available: see fulltext.].