Correlation between macroscopic properties and microscopic parameters versus stress in tetragonal Pb (Mg 1/3Nb 2/3) 0.6Ti 0.4O 3 ferroelectric ceramics

Abstract

The influence of domain switching on the evolution of macroscopic polarization in the ferroelectric Pb (Mg13 Nb23) 1-x Tix O3 material was studied. Domain switching during the application of a compressive stress was evaluated using in situ x-ray diffraction. It was found that stress depolarization was controlled by 90° domain reorientation. Details on domain switching quantification were given for samples with their surface parallel to the polar axis. From x-ray data, the macroscopic polarization versus stress was also simulated, underlying a strong correlation between microscopic parameters and macroscopic properties. This simulation was based on the assumption that the dipolar moment of the unit cell does not change with stress. The x-ray diffraction was established as a viable nondestructive technique for the determination of remnant polarization. © 2006 American Institute of Physics.