Conductance between two scanning-tunneling-microscopy probes in carbon nanotubes

Abstract

The conductance image between two probes of scanning tunneling microscopy (STM) is calculated in an armchair carbon nanotube within a tight-binding model and a realistic model for STM probes. A Kekulé-type pattern usually appears due to interference of states at K and K′ points except in special cases. ©2008 The Physical Society of Japan.