Recent development of PeakForce Tapping mode atomic force microscopy and its applications on nanoscience

Abstract

Nanoscience is a booming field incorporating some of the most fundamental questions concerning structure, function, and applications. The cutting-edge research in nanoscience requires access to advanced techniques and instrumentation capable of approaching these unanswered questions. Over the past few decades, atomic force microscopy (AFM) has been developed as a powerful platform, which enables in situ characterization of topological structures, local physical properties, and even manipulating samples at nanometer scale. Currently, an imaging mode called PeakForce Tapping (PFT) has attracted more and more attention due to its advantages of nondestructive characterization, high-resolution imaging, and concurrent quantitative property mapping. In this review, the origin, principle, and advantages of PFT on nanoscience are introduced in detail. Three typical applications of this technique, including high-resolution imaging of soft samples in liquid environment, quantitative nanomechanical property mapping, and electrical/electrochemical property measurement will be reviewed comprehensively. The future trends of PFT technique development will be discussed as well.