Improved Czochralski growth of germanium single crystals from a melt covered by boron oxide

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Abstract

In germanium (Ge) crystal growth, a serious problem in growing high quality Ge crystals is the formation of germanium-oxide-particles on the melt surface. In addition, B doping in Ge crystals is very dificult because of the segregation coefficient, which is greater than unity, and the instability of free B atoms in the Ge melt. We have found a unique solution, which is CZ-Ge crystal growth from a melt covered by boron oxide (B2O3). Ge crystals which are dislocation-free and/or oxygen-enriched can be grown by these improved CZ techniques. Current and planned research using such Ge crystals is introduced.

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Taishi, T., Yonenaga, I., & Hoshikawa, K. (2013). Improved Czochralski growth of germanium single crystals from a melt covered by boron oxide. Acta Physica Polonica A, 124(2), 231–234. https://doi.org/10.12693/APhysPolA.124.231

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