Instability of nanoscale metallic particles under electron irradiation in TEM

Abstract

The stability of nano metallic glass under electron beam in transmission electron microscope (TEM) was investigated. The most common voltage of TEM used in metallic materials characterization was either 200 kV or 300 kV. Both situations were investigated in this work. An amorphous metallic particle with a dimension of a few hundred nanometers was tested under 300 keV electron irradiation. New phase decomposed from the parent phase was observed. Moreover, a crystal particle with the same composition and dimension was tested under 200 keV irradiation. Decomposition process also occurred in this situation. Besides, crystal orientation modification was observed during irradiation. These results proved that the electron beam in TEM have an effect on the stability of nanoscale samples during long time irradiation. Atomic displacement was induced and diffusion was enhanced by electron irradiation. Thus, artifacts would be induced when a nanoscale metallic sample was characterized in TEM.