Here polyethylene, as an example of an important soft material, was studied by STEM annular bright and dark field. The contrast as function of the probe size/shape and the detector collection angle are discussed. The results are compared to conventional bright field transmission electron microscopy, electron energy filtered imaging and energy dispersive spectroscopy mapping. Annular bright and dark field gave a higher contrast than conventional transmission and analytical mapping techniques. © 2006 IOP Publishing Ltd.
CITATION STYLE
Van Helvoort, A. T. J., Tanem, B. S., & Holmestad, R. (2006). Annular bright and dark field imaging of soft materials. In Journal of Physics: Conference Series (Vol. 26, pp. 42–45). Institute of Physics Publishing. https://doi.org/10.1088/1742-6596/26/1/010
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