Low temperature electrical resistivity of polycrystalline La 0.67Sr0.33MnO3 thin films

14Citations
Citations of this article
15Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Electrical transport properties of La0.67Sr 0.33MnO3 polycrystalline thin films are studied in the temperature range 13 -300 K and in magnetic fields up to 3 kOe. It is found that the resistivity of the sample with ellipsoidal grains exhibits an insulating behavior at low temperature. Detailed analysis of experimental data shows that the Variable Range Hopping model cannot apply to this sample. Negative magnetoresistance is explained by assuming that the transport occurs through the mechanism of inter-granular (insulating) as well as granular (metallic) paths connected in series. By qualitatively comparing the relative fractions of these channels, we explain the resistivity behavior in each temperature range. © 2013 Elsevier Ltd.

Cite

CITATION STYLE

APA

Narjis, A., El kaaouachi, A., Biskupski, G., Daoudi, E., Limouny, L., Dlimi, S., … Sybous, A. (2013). Low temperature electrical resistivity of polycrystalline La 0.67Sr0.33MnO3 thin films. Materials Science in Semiconductor Processing, 16(5), 1257–1261. https://doi.org/10.1016/j.mssp.2013.01.004

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free