Enhancement of image sharpness and height measurement using a low-speckle light source based on a patterned quantum dot film in dual-wavelength digital holography

  • Jang S
  • Kim K
  • Jung J
  • et al.
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Abstract

A dual-wavelength single light source based on a patterned quantum dot (QD) film was developed with a 405nm LED and bandpass filters to increase color conversion efficiency as well as to decouple the two peaks of dual-wavelength emitted from the QD film. A QD film was patterned laterally with two different sizes of QDs and was combined with bandpass filters to produce a high efficiency and low-speckle dual-wavelength light source. The experimental results showed that the developed dual-wavelength light source can decrease speckle noise to improve the reconstructed image sharpness and the accuracy on height measurement in dual-wavelength digital holography.

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Jang, S. H., Kim, K. B., Jung, J., & Kim, Y.-J. (2021). Enhancement of image sharpness and height measurement using a low-speckle light source based on a patterned quantum dot film in dual-wavelength digital holography. Optics Express, 29(21), 34220. https://doi.org/10.1364/oe.440158

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