Book Chapter

Test generation and lightweight checking for multi-core memory consistency

Springer International Publishing, (2018), 145-178
DOI: 10.1007/978-3-319-98116-1_9
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APA

Lee, D., & Bertacco, V. (2018). Test generation and lightweight checking for multi-core memory consistency. In Post-Silicon Validation and Debug (pp. 145–178). Springer International Publishing. https://doi.org/10.1007/978-3-319-98116-1_9

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