Embedded loopback test for RF ICs

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Abstract

This paper explores the use of on-chip or on-wafer loopback implementations for verifying performance of 5-GHz wireless local area network (WLAN) IC circuits. The loopback test diagram, the test-circuit design, and the characterization data are reported for subcircuits (attenuators, and switches) necessary to implement 5-GHz transceiver loopback. A loopback circuit that can be applied to transceiver loopback measurements is demonstrated. This research is exploratory in nature and is a first attempt at a new on-chip RF test technique. © 2005 IEEE.

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Yoon, J. S., & Eisenstadt, W. R. (2005). Embedded loopback test for RF ICs. IEEE Transactions on Instrumentation and Measurement, 54(5), 1715–1720. https://doi.org/10.1109/TIM.2005.855091

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