Abstract
We report on a simulation algorithm, based on kinetic Monte Carlo techniques, that allows us to investigate transport through high-permittivity dielectrics. In the example of TiN/ ZrO2 /TiN capacitor structures, using best-estimate physical parameters, we have identified the dominant transport mechanisms. Comparison with experimental data reveals the transport to be dominated by Poole-Frenkel emission from donorlike trap states at low fields and trap-assisted tunneling at high fields. © 2010 American Institute of Physics.
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CITATION STYLE
Jegert, G., Kersch, A., Weinreich, W., Schröder, U., & Lugli, P. (2010). Modeling of leakage currents in high- κ dielectrics: Three-dimensional approach via kinetic Monte Carlo. Applied Physics Letters, 96(6). https://doi.org/10.1063/1.3310065
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